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Strained Si and Ge Channels.

Authors :
Balestra, Francis
Source :
Nanoscale CMOS: Innovative Materials, Modeling & Characterization; 2013, p69-126, 58p
Publication Year :
2013

Details

Language :
English
ISBNs :
9781848211803
Database :
Complementary Index
Journal :
Nanoscale CMOS: Innovative Materials, Modeling & Characterization
Publication Type :
Book
Accession number :
88204548
Full Text :
https://doi.org/10.1002/9781118621523.ch3