D-OPTIMAL SEQUENTIAL EXPERIMENTS FOR GENERATING A SIMULATION-BASED CYCLE TIME--THROUGHPUT CURVE.

A cycle time-throughput curve quantifies the relationship of average cycle time to throughput rates in a manufacturing system. Moreover, it indicates the asymptotic capacity of a system. Such a curve is used to characterize system performance over a range of start rates. Simulation is a fundamental method for generating such curves since simulation can handle the complexity of real systems with acceptable precision and accuracy. A simulation-based cycle time-throughput curve requires a large amount of simulation output data; the precision and accuracy of a simulated curve may be poor if there is insufficient simulation data. To overcome these problems, sequential simulation experiments based on a nonlinear D-optimal design are suggested. Using the nonlinear shape of the curve, such a design pinpoints p starting design points, and then sequentially ranks the remaining n=p candidate design points, where n is the total number of possible design points being considered. A model of a semiconductor wafer fabrication facility is used to validate the approach. The sequences of experimental runs generated can be used as references for simulation experimenters. [ABSTRACT FROM AUTHOR]