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Characterization of Valence Band Offsets in P-SI/SIGE/SI by Space Charge Spectroscopy.
- Source :
- MRS Online Proceedings Library; 01/29/1993, Vol. 326, pN.PAG-1, 1p
- Publication Year :
- 1993
Details
- Language :
- English
- ISSN :
- 19464274
- Volume :
- 326
- Database :
- Complementary Index
- Journal :
- MRS Online Proceedings Library
- Publication Type :
- Conference
- Accession number :
- 86852529
- Full Text :
- https://doi.org/10.1557/PROC-326-389