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Deposition, Structural Characterization, and Broadband (1KHz-40GHz) Dielectric Behavior of BaxTi2-xOy Thin Films.

Authors :
Liu, W.-T.
Cochrane, S.
Beckage, P.
Knorr, D. B.
Lu, T.-M.
Borrego, J. M.
Rymaszewski, E. J.
Source :
MRS Online Proceedings Library; 01/13/1993, Vol. 310, pN.PAG-1, 1p
Publication Year :
1993

Details

Language :
English
ISSN :
19464274
Volume :
310
Database :
Complementary Index
Journal :
MRS Online Proceedings Library
Publication Type :
Conference
Accession number :
86851222
Full Text :
https://doi.org/10.1557/PROC-310-157
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