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Diffusion of Au in Amorphous Si Measured by the Artificial Multilayer Technique.

Authors :
Nygren, E.
Park, B.
Goldman, L.M.
Wu, D.T.
Wagner, A.V.
Spaepen, F.
Source :
MRS Online Proceedings Library; 01/25/1989, Vol. 163, pN.PAG-1, 1p
Publication Year :
1989

Details

Language :
English
ISSN :
19464274
Volume :
163
Database :
Complementary Index
Journal :
MRS Online Proceedings Library
Publication Type :
Conference
Accession number :
86839782
Full Text :
https://doi.org/10.1557/PROC-163-627