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Degradation of High and Low Voltage Amorphous Silicon Thin Film Transistors Due to Air Leak.
- Source :
- MRS Online Proceedings Library; 01/11/1989, Vol. 149, pN.PAG-1, 1p
- Publication Year :
- 1989
Details
- Language :
- English
- ISSN :
- 19464274
- Volume :
- 149
- Database :
- Complementary Index
- Journal :
- MRS Online Proceedings Library
- Publication Type :
- Conference
- Accession number :
- 86838731
- Full Text :
- https://doi.org/10.1557/PROC-149-277