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A Study of the Morphology of Titanium Silicide Films and the Titanium Silicide-Silicon Interface.

Authors :
De Lanerolle, N.
Moser, L.
Hoffman, D.
Ma, D.
Sterner, D.
Source :
MRS Online Proceedings Library; 01/08/1989, Vol. 146, pN.PAG-1, 1p
Publication Year :
1989

Details

Language :
English
ISSN :
19464274
Volume :
146
Database :
Complementary Index
Journal :
MRS Online Proceedings Library
Publication Type :
Conference
Accession number :
86838539
Full Text :
https://doi.org/10.1557/PROC-146-273