Three Dimensional Characterization of Interfaces in Semiconductors by Scanning Electron Microscopy.

MLA

Joy, David C., et al. “Three Dimensional Characterization of Interfaces in Semiconductors by Scanning Electron Microscopy.” MRS Online Proceedings Library, vol. 69, Jan. 1986, p. N.PAG-1. EBSCOhost, https://doi.org/10.1557/PROC-69-171.

APA

Joy, D. C., Maher, D. M., & Farrow, R. C. (1986). Three Dimensional Characterization of Interfaces in Semiconductors by Scanning Electron Microscopy. MRS Online Proceedings Library, 69, N.PAG-1. https://doi.org/10.1557/PROC-69-171

Chicago

Joy, David C., D. M. Maher, and R C Farrow. 1986. “Three Dimensional Characterization of Interfaces in Semiconductors by Scanning Electron Microscopy.” MRS Online Proceedings Library 69 (January): N.PAG-1. doi:10.1557/PROC-69-171.