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Transmission electron microscopy and x-ray structural investigation of La0.7Ca0.3MnO3 thin films.

Authors :
Li, Y. H.
Thomas, K. A.
de Silva, P. S. I. P. N.
Cohen, L. F.
Goyal, A.
Rajeswari, M.
Mathur, N. D.
Blamire, M. G.
Evetts, J. E.
Venkatesan, T.
MacManus-Driscoll, J. L.
Source :
Journal of Materials Research; 08/01/1998, Vol. 13 Issue 8, p2161-2169, 9p
Publication Year :
1998

Details

Language :
English
ISSN :
08842914
Volume :
13
Issue :
8
Database :
Complementary Index
Journal :
Journal of Materials Research
Publication Type :
Academic Journal
Accession number :
86812259
Full Text :
https://doi.org/10.1557/JMR.1998.0302