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The atomic structure of growth interfaces in Y–Ba–Cu–O thin films.

Authors :
Ramesh, R.
Inam, A.
Hwang, D.M.
Ravi, T.S.
Sands, T.
Xi, X.X.
Wu, X.D.
Li, Q.
Venkatesan, T.
Kilaas, R.
Source :
Journal of Materials Research; 11/01/1991, Vol. 6 Issue 11, p2264-2271, 8p
Publication Year :
1991

Details

Language :
English
ISSN :
08842914
Volume :
6
Issue :
11
Database :
Complementary Index
Journal :
Journal of Materials Research
Publication Type :
Academic Journal
Accession number :
86809147
Full Text :
https://doi.org/10.1557/JMR.1991.2264