Analysis of depth profiles of sol-gel derived multilayer coatings by Rutherford backscattering spectrometry and by cross-sectional transmission electron microscopy1.

Details

Language :

English

ISSN :

08842914

Volume :

6

Issue :

4

Database :

Complementary Index

Journal :

Journal of Materials Research

Publication Type :

Academic Journal

Accession number :

86809003

Full Text :

https://doi.org/10.1557/JMR.1991.0835