Validation of EMC near-field scanning amplitude and phase measurement data.

Authors :: Mynster, Anders P.
Sorensen, Morten
Source :: International Symposium on Electromagnetic Compatibility - EMC EUROPE; 1/ 1/2012, p1-6, 6p
Publication Year :: 2012
Abstract: A frequency selection and data validation procedure is presented. It shows that using data from the reference channel it makes possible to estimate the validity of the measured data from an EMC near-field scan with phase on active circuits. [ABSTRACT FROM PUBLISHER]

Language :: English
ISBNs :: 9781467307185
Database :: Complementary Index
Journal :: International Symposium on Electromagnetic Compatibility - EMC EUROPE
Publication Type :: Conference
Accession number :: 86618538
Full Text :: https://doi.org/10.1109/EMCEurope.2012.6396836