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Switching controllability of high voltage GaN-HEMTs and the cascode connection.
- Source :
- 2012 24th International Symposium on Power Semiconductor Devices & ICs; 1/ 1/2012, p229-232, 4p
- Publication Year :
- 2012
-
Abstract
- This paper reports that the switching controllability of high-voltage GaN-HEMTs and the cascode connection depends on the feedback capacitance design. The switching behavior of the GaN-HEMT can be controlled by the external gate resistance as the same manner as the conventional Si-MOSFETs. The switching controllability was improved by the substrate connection due to the parasitic capacitance change. The controllability of the cascode connection was slightly worse compared with the Si-MOSFET, because the effective feedback capacitance became small by the step by step switching operation. [ABSTRACT FROM PUBLISHER]
Details
- Language :
- English
- ISBNs :
- 9781457715945
- Database :
- Complementary Index
- Journal :
- 2012 24th International Symposium on Power Semiconductor Devices & ICs
- Publication Type :
- Conference
- Accession number :
- 86504035
- Full Text :
- https://doi.org/10.1109/ISPSD.2012.6229065