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Impact of process variability on the radiation-induced soft error of nanometer-scale srams in hold and read conditions.
- Source :
- 2011 12th European Conference on Radiation & Its Effects on Components & Systems; 1/ 1/2011, p195-201, 7p
- Publication Year :
- 2011
-
Abstract
- Process variation affects the soft-error sensitivity of SRAM cells. A complex dependence on the arrival time of the particle strike relative to the word-line clock is observed. [ABSTRACT FROM PUBLISHER]
Details
- Language :
- English
- ISBNs :
- 9781457705854
- Database :
- Complementary Index
- Journal :
- 2011 12th European Conference on Radiation & Its Effects on Components & Systems
- Publication Type :
- Conference
- Accession number :
- 86473389
- Full Text :
- https://doi.org/10.1109/RADECS.2011.6131303