Application of the model microfield method to Stark profiles of overlapping and isolated neutral lines.

Details

Language :

English

ISSN :

00223700

Volume :

9

Issue :

7

Database :

Complementary Index

Journal :

Journal of Physics B: Atomic & Molecular Physics

Publication Type :

Academic Journal

Accession number :

86100248

Full Text :

https://doi.org/10.1088/0022-3700/9/7/015