A robust and simple two-mode digital calibration technique for pipelined ADC.

Details

Language :

English

ISSN :

16744926

Volume :

32

Issue :

3

Database :

Complementary Index

Journal :

Journal of Semiconductors

Publication Type :

Academic Journal

Accession number :

86090808

Full Text :

https://doi.org/10.1088/1674-4926/32/3/035001