Characterization of -doped superlattices by Shubnikov - de Haas measurements.

Details

Language :

English

ISSN :

02681242

Volume :

11

Issue :

2

Database :

Complementary Index

Journal :

Semiconductor Science & Technology

Publication Type :

Academic Journal

Accession number :

86086743

Full Text :

https://doi.org/10.1088/0268-1242/11/2/008