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High Intensity Beam and X-Ray Converter Target Interactions and Mitigation.

Authors :
Chen, Yu-Jiuan
McCarrick, James F.
Guethlein, Gary
Caporaso, George J.
Chambers, Frank
Falabella, Steven
Lauer, Eugene
Richardson, Roger
Sampayan, Steve
Weir, John
Source :
AIP Conference Proceedings; 2002, Vol. 647 Issue 1, p240, 15p
Publication Year :
2002

Abstract

Ions extracted from a solid surface or plasma by impact of an high intensity and high current electron beam can partially neutralize the beam space charge and change the focusing system. We have investigated ion emission computationally and experimentally. By matching PIC simulation results with available experimental data, our finding suggests that if a mix of ion species is available at the emitting surface, protons dominate the backstreaming ion effects, and that, unless there is surface flashover, ion emission is source limited. We have also investigated mitigation, such as e-beam cleaning, laser cleaning and ion trapping with a foil barrier. The temporal behavior of beam spot size with a foil barrier and a focusing scheme to improve foil barrier performance are discussed. [ABSTRACT FROM AUTHOR]

Subjects

Subjects :
ELECTRON beams
SPACE charge

Details

Language :
English
ISSN :
0094243X
Volume :
647
Issue :
1
Database :
Complementary Index
Journal :
AIP Conference Proceedings
Publication Type :
Conference
Accession number :
8584277