Three dimensional reciprocal space measurement by x-ray diffraction using linear and area detectors: Applications to texture and defects determination in oriented thin films and nanoprecipitates.

MLA

Gaudet, Simon, et al. “Three Dimensional Reciprocal Space Measurement by X-Ray Diffraction Using Linear and Area Detectors: Applications to Texture and Defects Determination in Oriented Thin Films and Nanoprecipitates.” Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films, vol. 31, no. 2, Mar. 2013, pp. 021505-021505-13. EBSCOhost, https://doi.org/10.1116/1.4789984.

APA

Gaudet, S., De Keyser, K., Lambert-Milot, S., Jordan-Sweet, J., Detavernier, C., Lavoie, C., & Desjardins, P. (2013). Three dimensional reciprocal space measurement by x-ray diffraction using linear and area detectors: Applications to texture and defects determination in oriented thin films and nanoprecipitates. Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films, 31(2), 021505-021505-13. https://doi.org/10.1116/1.4789984

Chicago

Gaudet, Simon, Koen De Keyser, Samuel Lambert-Milot, Jean Jordan-Sweet, Christophe Detavernier, Christian Lavoie, and Patrick Desjardins. 2013. “Three Dimensional Reciprocal Space Measurement by X-Ray Diffraction Using Linear and Area Detectors: Applications to Texture and Defects Determination in Oriented Thin Films and Nanoprecipitates.” Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films 31 (2): 021505-021505-13. doi:10.1116/1.4789984.