Back to Search Start Over

Models for process compensated resonant testing (PCRT) of silicon nitride balls.

Authors :
Aldrin, John C.
Jauriqui, Leanne
Hunter, Lem
Source :
AIP Conference Proceedings; Jan2013, Vol. 1511 Issue 1, p1393-1400, 8p, 2 Diagrams, 4 Graphs
Publication Year :
2013

Abstract

The paper presents recent progress to model process compensated resonant testing (PCRT) for silicon nitride balls. An analytical model was developed that accurately describes the series of surface acoustic wave (SAW) and intermediate Whispering Gallery (WG) modes. A finite element method model of an elastic sphere was also developed to study the effect of surface flaws on the modal response. Using the numerical model, it was shown that the higher frequency SAW modes will degenerate in most cases as shifts lower in frequency with increasing crack dimensions. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0094243X
Volume :
1511
Issue :
1
Database :
Complementary Index
Journal :
AIP Conference Proceedings
Publication Type :
Conference
Accession number :
85094231
Full Text :
https://doi.org/10.1063/1.4789205