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A CMOS Temperature Sensor With a Voltage-Calibrated Inaccuracy of \pm0.15 ^\circC (3\sigma) From -55^\circC to 125^\circC.
- Source :
- IEEE Journal of Solid-State Circuits; Jan2013, Vol. 48 Issue 1, p292-301, 10p
- Publication Year :
- 2013
-
Abstract
- This paper describes the design of a low power, energy-efficient CMOS smart temperature sensor intended for RFID temperature sensing. The BJT-based sensor employs an energy- efficient 2nd-order zoom ADC, which combines a coarse 5-bit SAR conversion with a fine 10-bit ΔΣ conversion. Moreover, a new integration scheme is proposed that halves the conversion time, while requiring no extra supply current. To meet the stringent cost constraints on RFID tags, a fast voltage calibration technique is used, which can be carried out in only 200 msec. After batch calibration and an individual room-temperature calibration, the sensor achieves an inaccuracy of \pm 0.15^\circ\C (3\sigma) from -55^\circ\C to 125^\circ\C. Over the same range, devices from a second lot achieved an inaccuracy of \pm 0.25^\circ\C (3\sigma) in both ceramic and plastic packages. The sensor occupies 0.08 \mm^2 in a 0.16 \mu\m CMOS process, draws 3.4 \mu\A from a 1.5 V to 2 V supply, and achieves a resolution of 20 mK in a conversion time of 5.3 msec. This corresponds to a minimum energy dissipation of 27 nJ per conversion. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00189200
- Volume :
- 48
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- IEEE Journal of Solid-State Circuits
- Publication Type :
- Academic Journal
- Accession number :
- 84636262
- Full Text :
- https://doi.org/10.1109/JSSC.2012.2214831