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Ultra-Low Emissivity Alpha-Particle Detection.

Authors :
Gordon, Michael S.
Rodbell, Kenneth P.
Tang, Henry H. K.
Ronsheim, Paul
Zhu, Zhengmao
Rauch, Stewart E.
McNally, Brendan D.
Coleman, Stuart
Source :
IEEE Transactions on Nuclear Science; Dec2012 Part 1, Vol. 59 Issue 6, p3101-3109, 9p
Publication Year :
2012

Abstract

New alpha counters make accurate measurements of low emissivity samples possible. Modeling results set lower limits for measurements at sea level of silicon substrates to about 0.3\ \alpha/\ khr-cm^2. Our measurements demonstrate the effect of cosmic ray shielding on the measured alpha-particle emissivity. A few atoms of radon contamination can cause elevated emissivities many days after exposure. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189499
Volume :
59
Issue :
6
Database :
Complementary Index
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
84360308
Full Text :
https://doi.org/10.1109/TNS.2012.2223234