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Scan-chain based watch-points for efficient run-time debugging and verification of FPGA designs.

Authors :
Tiwari, Anurag
Tomko, Karen A.
Source :
Proceedings of the 2003 Asia & South Pacific Design Automation Conference; 1/21/2003, p705-711, 7p
Publication Year :
2003

Details

Language :
English
ISBNs :
9780780376601
Database :
Complementary Index
Journal :
Proceedings of the 2003 Asia & South Pacific Design Automation Conference
Publication Type :
Conference
Accession number :
84152058
Full Text :
https://doi.org/10.1145/1119772.1119930