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Built-in generation of weighted test sequences for synchronous sequential circuits.
- Source :
- Proceedings of the Conference: Design, Automation & Test in Europe (9781581132441); Mar2000, p298-304, 7p
- Publication Year :
- 2000
Details
- Language :
- English
- ISBNs :
- 9781581132441
- Database :
- Complementary Index
- Journal :
- Proceedings of the Conference: Design, Automation & Test in Europe (9781581132441)
- Publication Type :
- Conference
- Accession number :
- 83799422
- Full Text :
- https://doi.org/10.1145/343647.343785