The effect of process variation on device temperature in FinFET circuits.

Details

Language :

English

ISBNs :

9781424413829

Database :

Complementary Index

Journal :

2007 IEEE/ACM International Conference on Computer-Aided Design

Publication Type :

Conference

Accession number :

83782563

Full Text :

https://doi.org/10.1109/iccad.2007.4397355