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Automated fault localization with statistically suspicious program states.

Authors :
Huang, Tai-Yi
Chou, Pin-Chuan
Tsai, Cheng-Han
Chen, Hsin-An
Source :
Proceedings of the 2007 ACM SIGPLAN/SIGBED Conference: Languages, Compilers & Tools for Embedded Systems; 6/13/2007, p11-20, 10p
Publication Year :
2007

Details

Language :
English
ISBNs :
9781595936325
Database :
Complementary Index
Journal :
Proceedings of the 2007 ACM SIGPLAN/SIGBED Conference: Languages, Compilers & Tools for Embedded Systems
Publication Type :
Conference
Accession number :
83671478
Full Text :
https://doi.org/10.1145/1254766.1254769