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On testing delay faults in macro-based combinational circuits.
- Source :
- Proceedings of the 1994 IEEE/ACM International Conference: Computer-aided Design; 11/ 6/1994, p332-339, 8p
- Publication Year :
- 1994
Details
- Language :
- English
- ISBNs :
- 9780897916905
- Database :
- Complementary Index
- Journal :
- Proceedings of the 1994 IEEE/ACM International Conference: Computer-aided Design
- Publication Type :
- Conference
- Accession number :
- 83632702