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PVT Compensation for Wilkinson Single-Slope Measurement Systems.

Authors :
Tham, K. V.
Ulaganathan, C.
Nambiar, N.
Greenwell, R. L.
Britton, C. L.
Ericson, M. N.
Holleman, J.
Blalock, B. J.
Source :
IEEE Transactions on Nuclear Science; 10/22/2012 Part 3, Vol. 59 Issue 5, p2444-2450, 7p
Publication Year :
2012

Abstract

A pulse-width locked loop (PWLL) circuit is reported that compensates for process, voltage, and temperature (PVT) variations of a linear ramp generator within a 12-bit multi-channel Wilkinson (single-slope integrating) Analog-to-Digital converter (ADC). This PWLL was designed and fabricated in a 0.5-\mum Silicon Germanium (SiGe) BiCMOS process. Simulation and silicon measurement data are shown that demonstrate a large improvement in the accuracy of the PVT-compensated ADC over the uncompensated ADC. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
00189499
Volume :
59
Issue :
5
Database :
Complementary Index
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
82710179
Full Text :
https://doi.org/10.1109/TNS.2012.2212722