Characterization of Ge2Sb2Te5 thin film alloys using conductive-tip atomic force microscopy.

Conductive-tip atomic force microscopy (C-AFM) is a powerful tool for investigating the electrical characteristics of phase-change materials commonly used for electronic and optical data storage. We demonstrate the usefulness of this technique by examining the electrical conductivity of crystalline marks recorded with a focused laser pulse on a thin Ge₂Sb₂Te₅ film. [ABSTRACT FROM AUTHOR]