An efficient statistical model using electrical tests for GHz CMOS devices.

Details

Language :

English

ISBNs :

9780780358966

Database :

Complementary Index

Journal :

2000 5th International Workshop on Statistical Metrology (Cat.No.00TH8489)

Publication Type :

Conference

Accession number :

82111497

Full Text :

https://doi.org/10.1109/IWSTM.2000.869315