Impact analysis of process variability on digital circuits with performance limited yield.

Details

Language :

English

ISBNs :

9780780366886

Database :

Complementary Index

Journal :

2001 6th International Workshop on Statistical Methodology (Cat. No.01TH8550)

Publication Type :

Conference

Accession number :

82110658

Full Text :

https://doi.org/10.1109/IWSTM.2001.933828