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Stacked-chip packaging: electrical, mechanical, and thermal challenges.

Authors :
Awad, E.
Hanyi Ding
Graf, R.S.
Maloney, J.J.
Source :
2004 Proceedings 54th Electronic Components & Technology Conference (IEEE Cat. No.04CH37546); 2004, p1608-1608, 1p
Publication Year :
2004

Details

Language :
English
ISBNs :
9780780383654
Database :
Complementary Index
Journal :
2004 Proceedings 54th Electronic Components & Technology Conference (IEEE Cat. No.04CH37546)
Publication Type :
Conference
Accession number :
82011627
Full Text :
https://doi.org/10.1109/ECTC.2004.1320330