An expert system architecture to detect system-level automotive EMC problems.

Authors :: Ranganathan, S.
Beetner, D.G.
Wiese, R.
Hubing, T.H.
Source :: 2002 IEEE International Symposium on Electromagnetic Compatibility; 2002, p976-976, 1p
Publication Year :: 2002

Language :: English
ISBNs :: 9780780372641
Database :: Complementary Index
Journal :: 2002 IEEE International Symposium on Electromagnetic Compatibility
Publication Type :: Conference
Accession number :: 82004618
Full Text :: https://doi.org/10.1109/ISEMC.2002.1032828