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Using a planar hall effect sensor for single bead detection.

Authors :
Volmer, M.
Avram, M.
Avram, A.M.
Source :
2010 International Semiconductor Conference (CAS); 2010, p221-224, 4p
Publication Year :
2010

Details

Language :
English
ISBNs :
9781424457830
Database :
Complementary Index
Journal :
2010 International Semiconductor Conference (CAS)
Publication Type :
Conference
Accession number :
81993792
Full Text :
https://doi.org/10.1109/SMICND.2010.5650494