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X-ray diffraction analysis of threading dislocation densities in epitaxial layers as grown by MOCVD.
- Source :
- CLEO/Pacific Rim 2003. the 5th Pacific Rim Conference on Lasers & Electro-Optics (IEEE Cat. No.03TH8671); 2003, p226-226, 1p
- Publication Year :
- 2003
Details
- Language :
- English
- ISBNs :
- 9780780377660
- Database :
- Complementary Index
- Journal :
- CLEO/Pacific Rim 2003. the 5th Pacific Rim Conference on Lasers & Electro-Optics (IEEE Cat. No.03TH8671)
- Publication Type :
- Conference
- Accession number :
- 81944725
- Full Text :
- https://doi.org/10.1109/CLEOPR.2003.1274683