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Polishing damages to electrical properties of BLT thin film capacitors fabricated by damascene process of chemical mechanical polishing.

Authors :
Kim, Nam-Hoon
Pan-Gum Jung
Ko, Pil-Ju
Lee, Woo-Sun
Source :
2008 17th IEEE International Symposium on the Applications of Ferroelectrics; 2008, p1-2, 2p
Publication Year :
2008

Details

Language :
English
ISBNs :
9781424427444
Database :
Complementary Index
Journal :
2008 17th IEEE International Symposium on the Applications of Ferroelectrics
Publication Type :
Conference
Accession number :
81936864
Full Text :
https://doi.org/10.1109/ISAF.2008.4693730