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Nanometer-scale surface element analysis using laser ablation atomic fluorescence spectroscopy.

Authors :
Higotani, T.
Kim, M.K.
Takao, T.
Oki, Y.
Maeda, M.
Source :
Technical Digest. CLEO/Pacific Rim 2001. 4th Pacific Rim Conference on Lasers & Electro-Optics (Cat. No.01TH8557); 2001, pI34-I34, 1p
Publication Year :
2001

Details

Language :
English
ISBNs :
9780780367388
Database :
Complementary Index
Journal :
Technical Digest. CLEO/Pacific Rim 2001. 4th Pacific Rim Conference on Lasers & Electro-Optics (Cat. No.01TH8557)
Publication Type :
Conference
Accession number :
81877069
Full Text :
https://doi.org/10.1109/CLEOPR.2001.967713
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