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Application of interval models to the detection of faults in industrial processes.

Authors :
Armengol, J.
Vehi, J.
Sainz, M.A.
Herrero, P.
Source :
Proceedings World Automation Congress, 2004; 2004, p269-274, 6p
Publication Year :
2004

Details

Language :
English
ISBNs :
9781889335216
Database :
Complementary Index
Journal :
Proceedings World Automation Congress, 2004
Publication Type :
Conference
Accession number :
81867690
Full Text :
https://doi.org/10.1109/WAC.2004.185420