A statistical MOS model for CAD of submicrometer analog IC's.

Authors :: Crippa, P.
Turchetti, C.
Conti, M.
Source :: Proceedings of the 44th IEEE 2001 Midwest Symposium on Circuits & Systems, MWSCAS 2001 (Cat. No.01CH37257); 2001, p901-901, 1p
Publication Year :: 2001

Language :: English
ISBNs :: 9780780371507
Database :: Complementary Index
Journal :: Proceedings of the 44th IEEE 2001 Midwest Symposium on Circuits & Systems, MWSCAS 2001 (Cat. No.01CH37257)
Publication Type :: Conference
Accession number :: 81859590
Full Text :: https://doi.org/10.1109/MWSCAS.2001.986333