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Electron loss model with energy straggling for therapeutic beam dose calculations.

Authors :
Chvetsov, A.V.
Sandison, G.A.
Yeboah, C.
Source :
Proceedings of the 22nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (Cat. No.00CH37143); 2000, p3196-3196, 1p
Publication Year :
2000

Details

Language :
English
ISBNs :
9780780364653
Database :
Complementary Index
Journal :
Proceedings of the 22nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (Cat. No.00CH37143)
Publication Type :
Conference
Accession number :
81852623
Full Text :
https://doi.org/10.1109/IEMBS.2000.901575