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Diagnosis for intelligent field devices using the rough set theory.
- Source :
- Proceedings of the 21st IEEE Instrumentation & Measurement Technology Conference (IEEE Cat. No.04CH37510); 2004, p2060-2060, 1p
- Publication Year :
- 2004
Details
- Language :
- English
- ISBNs :
- 9780780382480
- Database :
- Complementary Index
- Journal :
- Proceedings of the 21st IEEE Instrumentation & Measurement Technology Conference (IEEE Cat. No.04CH37510)
- Publication Type :
- Conference
- Accession number :
- 81851649
- Full Text :
- https://doi.org/10.1109/IMTC.2004.1351494