A modular test structure for CMOS mismatch characterization.

Authors :: Conti, M.
Crippa, P.
Fedecostante, F.
Orcioni, S.
Ricciardi, F.
Turchetti, C.
Vendrame, L.
Source :: Proceedings of the 2003 International Symposium on Circuits & Systems, 2003 (ISCAS '03); 2003, pV569-V569, 1p
Publication Year :: 2003

Language :: English
ISBNs :: 9780780377615
Database :: Complementary Index
Journal :: Proceedings of the 2003 International Symposium on Circuits & Systems, 2003 (ISCAS '03)
Publication Type :: Conference
Accession number :: 81847490
Full Text :: https://doi.org/10.1109/ISCAS.2003.1206376