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Design of OTR beam profile monitors for the TESLA Test Facility, Phase 2 (TTF2).
- Source :
- Proceedings of the 2003 Bipolar/BiCMOS Circuits & Technology Meeting (IEEE Cat. No.03CH37440); 2003, p2476-2476, 1p
- Publication Year :
- 2003
Details
- Language :
- English
- ISBNs :
- 9780780377387
- Database :
- Complementary Index
- Journal :
- Proceedings of the 2003 Bipolar/BiCMOS Circuits & Technology Meeting (IEEE Cat. No.03CH37440)
- Publication Type :
- Conference
- Accession number :
- 81844985
- Full Text :
- https://doi.org/10.1109/PAC.2003.1289159