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Analysis of XPM-induced intensity distortion using the VSTF method.
- Source :
- LEOS 2001. 14th Annual Meeting of the IEEE Lasers & Electro-Optics Society (Cat. No.01CH37242); 2001, p279-279, 1p
- Publication Year :
- 2001
Details
- Language :
- English
- ISBNs :
- 9780780371057
- Database :
- Complementary Index
- Journal :
- LEOS 2001. 14th Annual Meeting of the IEEE Lasers & Electro-Optics Society (Cat. No.01CH37242)
- Publication Type :
- Conference
- Accession number :
- 81814127
- Full Text :
- https://doi.org/10.1109/LEOS.2001.969283