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Measurement technique for the extraction of differential S-parameters from single-ended S-parameters.

Authors :
Vaz, K.
Caggiano, M.
Source :
27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004; 2004, p313-313, 1p
Publication Year :
2004

Details

Language :
English
ISBNs :
9780780384224
Database :
Complementary Index
Journal :
27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004
Publication Type :
Conference
Accession number :
81756869
Full Text :
https://doi.org/10.1109/ISSE.2004.1490442
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