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Laser scanning calibration for porous silicon substrate useful in microarray applications.
- Source :
- 2009 International Semiconductor Conference; 2009, p147-150, 4p
- Publication Year :
- 2009
Details
- Language :
- English
- ISBNs :
- 9781424444137
- Database :
- Complementary Index
- Journal :
- 2009 International Semiconductor Conference
- Publication Type :
- Conference
- Accession number :
- 81747916
- Full Text :
- https://doi.org/10.1109/SMICND.2009.5336585