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DFM optimization of standard cells considering random and systematic defect.

Authors :
Daehyun Jang
Naya Ha
Joo-Hyun Park
Seung-Weon Paek
Hyo-Sig Won
Kyu-Myung Choi
Source :
2008 International SoC Design Conference; 2008, pI70-I73, 4p
Publication Year :
2008

Details

Language :
English
ISBNs :
9781424425983
Database :
Complementary Index
Journal :
2008 International SoC Design Conference
Publication Type :
Conference
Accession number :
81733340
Full Text :
https://doi.org/10.1109/SOCDC.2008.4815575