Methods and Tools for Reliability Driven Defect-and Fault-tolerant Design of Nanosystems.

Details

Language :

English

ISBNs :

9781424400775

Database :

Complementary Index

Journal :

2006 Sixth IEEE Conference on Nanotechnology

Publication Type :

Conference

Accession number :

81718140

Full Text :

https://doi.org/10.1109/NANO.2006.247651