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Breakdown Phenomena in the Negative Ion Source of 500 keV Negative-Ion Based NBI System on JT-60U.

Authors :
Hanada, M.
Ikeda, Y.
Kamada, M.
Kikuchi, K.
Komata, M.
Mogaki, K.
Umeda, N.
Usui, K.
Grisham, L.R.
Kobayashi, S.
Source :
2006 International Symposium on Discharges & Electrical Insulation in Vacuum; 2006, p718-721, 4p
Publication Year :
2006

Details

Language :
English
ISBNs :
9781424401918
Database :
Complementary Index
Journal :
2006 International Symposium on Discharges & Electrical Insulation in Vacuum
Publication Type :
Conference
Accession number :
81717980
Full Text :
https://doi.org/10.1109/DEIV.2006.357403