Quantitative evaluation of the safety of X-by-Wire architecture subject to EMI perturbations.

Details

Language :

English

ISBNs :

9780780394018

Database :

Complementary Index

Journal :

2005 IEEE Conference on Emerging Technologies & Factory Automation

Publication Type :

Conference

Accession number :

81693043

Full Text :

https://doi.org/10.1109/ETFA.2005.1612601